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For most semiconductor manufacturers, customer demands for product quality dictate a final quality inspection of every outgoing device. In many cases, customers hold manufacturers to a maximum allowable rate of defects per million (DPM) to ensure that customers' products are as reliable and cost-efficient as possible when they reach the market. To this end, more manufacturers are using package visual inspection (PVI) to realize quality improvements approaching zero DPM, while also reducing production costs.

Semiconductor yield refers to the percentage of functional chips produced during the manufacturing process. It is a critical parameter that directly affects production costs and profitability in the semiconductor industry.

Cost Reduction: Improving yield directly reduces production costs by minimizing the number of defective chips and reducing material waste.

Time-to-Market: Higher yield rates enable faster time-to-market, meeting consumer demand for advanced devices within shorter timelines.

Quality and Reliability: Higher yields correspond to higher-quality chips, ensuring reliable performance and longer lifespan of electronic devices.